Chinese researchers have identified a gene that could enhance wheat resistance to the wheat yellow mosaic disease, a condition caused by the wheat yellow mosaic virus. By using genome-editing technology to create wheat editing material with a knocked-out gene called TaeIF4E, and cultivating single, double, and triple mutant varieties, the researchers found that only the triple mutant variety showed complete resistance to the virus without a yield penalty. This finding suggests that engineering virus resistance through genome editing of the TaeIF4E gene could be a potential strategy for enhancing the virus resistance of major wheat varieties.